StellarNet Spectroscopy Learning Centres: Practical Resources for UV-Vis, NIR, Thin Film & Spectroradiometry
From: StellarNet
Posted On: 17 Aug 2026
Whether you’re measuring absorbance, reflectance, transmission, material composition, thin-film thickness or the spectral characteristics of a light source, understanding the measurement technique is an important first step.
StellarNet’s Spectroscopy Learning Centres bring together a collection of practical technical resources to help researchers, engineers and laboratory professionals better understand spectroscopy and optical measurement.
From application notes and technical guides to videos, FAQs and measurement resources, the StellarNet Learning Centres provide a useful starting point for exploring different spectroscopy techniques and their applications.
Explore StellarNet’s Spectroscopy Learning Centres
🔬 UV-Vis Spectroscopy 🔬
Absorbance | Transmission | Reflectance | Fluorescence | Colour Measurement
UV-Vis spectroscopy is widely used to measure how materials interact with ultraviolet and visible light.
Applications can include absorbance and transmission measurements, reflectance and colour analysis, fluorescence and chemical analysis.
StellarNet’s UV-Vis Spectroscopy Learning Centre provides resources for understanding UV-Vis measurement principles, applications and instrumentation, including application notes, videos, technical information, FAQs and practical guides.
Explore the UV-Vis Spectroscopy Learning Centre →
🌈 NIR Spectroscopy 🌈
Material Identification | Moisture | Chemical Analysis | Process Monitoring | Quality Control
Near-infrared spectroscopy provides a rapid, non-destructive approach to analysing materials and identifying chemical and physical properties.
NIR spectroscopy can be applied to areas such as moisture analysis, material identification, chemical analysis, plastics and polymers, process monitoring and quality control.
The StellarNet NIR Spectroscopy Learning Centre provides technical resources to help users understand NIR spectroscopy, its applications and the instrumentation used to perform NIR measurements.
Explore the NIR Spectroscopy Learning Centre →
📏 Thin Film Metrology 📏
Film Thickness | Optical Coatings | Reflectometry | Optical Metrology
Accurately measuring thin films and coatings is an important requirement across industries including semiconductor manufacturing, electronics, optics, displays, photovoltaics and research.
Spectroscopic measurement techniques can provide a non-contact approach to analysing thin-film structures and determining properties such as film thickness.
StellarNet’s Thin Film Metrology Learning Centre provides resources covering thin-film measurement, optical metrology and related applications.
Explore the Thin Film Metrology Learning Centre →
💡 Spectroradiometry 💡
Irradiance | Radiant Flux | LEDs | Lasers | Solar | Displays
Spectroradiometry provides a way to characterise light sources by measuring their spectral output.
Applications can range from LED and laser characterisation to irradiance measurements, solar measurements, display testing and other optical measurements.
The StellarNet Radiometry Learning Centre provides resources for understanding spectroradiometric measurements and the instrumentation used to characterise light across different applications.
Explore the Radiometry Learning Centre →
What Can You Learn?
The StellarNet Learning Centres are designed to help users move from understanding the fundamentals of a measurement technique to applying spectroscopy to real-world problems.
Depending on the application, resources cover topics such as:
- Spectroscopy fundamentals and measurement principles
- UV-Vis absorbance and transmission
- Reflectance and colour measurement
- NIR material and chemical analysis
- Moisture measurement
- Thin-film thickness and optical coatings
- Spectroscopic reflectometry
- Spectral irradiance and radiometry
- LED and laser characterisation
- Optical metrology
- Application-specific measurement techniques
- Spectrometer selection and configuration
The resource centres also provide access to practical application notes, technical documents, videos, FAQs, product information and other educational material.
Start With Your Measurement Application
Not sure which spectroscopy resource is most relevant to your application?
Use the guide below as a starting point:
| Your measurement | Recommended resource |
|---|---|
| Absorbance measurements | UV-Vis |
| Transmission measurements | UV-Vis |
| Reflectance measurements | UV-Vis |
| Colour measurement | UV-Vis |
| Fluorescence | UV-Vis |
| Moisture analysis | NIR |
| Material identification | NIR |
| Chemical analysis | NIR |
| Process monitoring | NIR |
| Thin-film thickness | Thin Film Metrology |
| Optical coatings | Thin Film Metrology |
| Spectroscopic reflectometry | Thin Film Metrology |
| Optical metrology | Thin Film Metrology |
| LED characterisation | Spectroradiometry |
| Laser measurement | Spectroradiometry |
| Irradiance measurement | Spectroradiometry |
| Solar measurements | Spectroradiometry |
Need Help With Your Spectroscopy Application?
Finding the right spectroscopy system often involves more than selecting a spectrometer.
Wavelength range, resolution, sensitivity, sampling method, optical configuration, accessories and measurement requirements can all influence the most appropriate system for an application.
Warsash Scientific supports StellarNet spectroscopy solutions in Australia and New Zealand, helping customers select and configure spectroscopy systems for research, laboratory, industrial and commercial applications.
If you’re unsure which measurement approach, spectrometer or optical configuration is right for your application, our team can help.
Talk to us TODAY! →
Discover More StellarNet Solutions
Explore StellarNet’s range of spectroscopy and optical measurement solutions available through Warsash Scientific.
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