Technology From: Polytec

Topography (White Light Interferometry)

Polytec is addressing the surface metrology market with innovative, high-precision 3-D profilometer technology that works on rough, smooth and stepped surfaces without contact. These products are based on scanning white-light interferometry, also called coherent or vertical scanning interferometry or coherence radar. With their large vertical range and nanometre resolution, they are ideal tools for determining flatness, height differences and parallelism of large surfaces and structures, including soft materials.

Technology From: Polytec

TopSens Profilometry & Microtopography

Height measurement has been the initial application for the TopSens distance sensors. A choice of sensor heads allow you to find an optimal solution in terms of measurement range, accuracy and lateral resolution. The controller is designed for easy integration into the manufacturing system.

The TopSens sensors can be configured for a wide range of applications and can easily be integrated into manufacturing lines for measuring depths of drilling or heights of welding seams, electrical contacts or solder bumps.

With their extended measurement range, these sensors are the perfect solution for accurate autofocus in vision systems.

Applications

• Online Inspection
• Level Control
• Thickness Measurement
• Profilometry and Microtopography
• Roughness Measurement