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neasnom nano imaging

neaSNOM nano imaging system from Neaspec

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Technology From: Neaspec

Ultra high resolution imaging and spectroscopy

Based on neaspec's revolutionary technology, neaSNOM is the only microscope on the market capable of imaging & spectroscopy in the visible, infrared and even terahertz spectral region at only 10 nm spatial resolution.

This makes neaSNOM the ideal tool for cutting-edge nanoanalytic applications such as chemical nano-composition (nano-FTIR-mode), nano-plasmonic fields, nanoscale stress/strain fields and free charge carrier distributions. Many scientists around the world trust in technology from neaspec for their publications in Nature, Science and other high impact journals.

Optimised to combine optical imaging and spectroscopy with AFM
  • Based on high-stability scanning-sample atomic force micrscope optimised for nanoscopy
  • Optical focusing unit accepts visible, infrared and even terahertz illumination
  • Patented dual port design allows two independent module bays for imaging and spectroscopy at the same time and for THz-TDS
  • Highly efficient optical near-field detection technique with patented background supression
  • Dedicated near-field detection modules optimised for high performance near-field imaging and spectroscopy
  • Transmission mode module for high performance near-field measurements with transparent samples (e.g. polymers)
Ready to use VIS, NIR, MIR and even THz illumination
  • VIS: 405, 532, 633, 785 or 808nm
  • NIR: 1064 or 1550nm
  • MIR: tunable QCL with up to 4 chips @ 250 1/cm: 3.6 - 12μm
  • THz: 0.1 - 3THz
VIS NIR and MIR wavelengths for spectroscopy and hyperspectral imaging
  • VIS: 600 - 1100nm
  • NIR: 980 - 2300nm
  • MIR: 2.4 - 4.2mu;m, 4.6 - 15.4μm
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Presented By: Neaspec

Neaspec's patented background supression technology

The spatial resolution of conventional optical microscopes is limited by diffraction to about half the wavelength (Abbe diffraction limit). neaspec broke the diffraction limit by developing the neaSNOM microscope, a groundbreaking apertureless near-field microscope (known as scattering-type Scanning Near-field Optical Microscopy, s-SNOM) that combines Atomic Force Microscopy with optical imaging and spectroscopy at the nanoscale.

neaSNOM employs standard metal-coated AFM probing tips (T), illuminated by a focused laser beam (L). Illuminated tips generate a nano-focus (N) at their apex, used as an ultra-small light source to locally probe the sample.

The size of the nano-focus is determined only by the radius of the tip apex. This is true even for electromagnetic waves much longer than the visible light, like infrared and terahertz radiation, yielding the same spatial resolution of 10 nm throughout the optical spectrum.

Because of an optical near-field interaction between the tip and the sample, the elastically backscattered light (S) contains information about the local optical properties (e.g. chemical ID) of the sample. The signal strength is several orders of magnitude higher when compared to inelastic light-scattering techniques like TERS (tip-enhanced Raman spectroscopy). Therefore neaSNOM allows any kind of orgnic and inorganic sample to be analysed with 100% reproducible and high quality data.

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