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Polytec

Polytec

www.polytec.com

Polytec is a global corporation with facilities in Europe, North America and Asia. With a reputation for innovative optical products, outstanding quality and world-class support, their success has enabled investment in the resources and flexibility to respond quickly to the ever-changing measurement needs of our customers.

Polytec's innovative measurement solutions allow customers to maintain their own technical leadership across many fields. In markets from automotive, data storage and aerospace to biomedical, micro- and nano-technology, Polytec continues to lead and inspire confidence and trust from their customers. In addition, product distribution remains as a core competency of Polytec, through successfully representing manufacturers of innovative technologies.


Non-Contact Vibration Sensors


Single-Point Vibrometers

Single-Point Vibrometers

Single-point vibrometers (out-of-plane vibrometers) measure the amount of vibration at a single point on an object's surface.
Technology From: Polytec

Single-Point Vibrometers

Single-point vibrometers measure the amount of vibration at a single point on an object's surface. More specifically, a laser vibrometer measures the projected component of an object's surface vibration vector along the direction of the incident laser beam. For example, if aligned perpendicularly to surface under test, the vibrometer measures the out-of-plane vibration to the surface (the instrument is sometimes referred to as an out-of-plane vibrometer).

pdf Measuring the Dynamic Response of Solar Panels (180KB)
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Scanning Vibrometers

Scanning Vibrometers

As your requirements expand, you can upgrade and enhance your vibrometer step by step.
Technology From: Polytec

Scanning Vibrometers

Polytec scanning vibrometers make vibration measurement and analysis simple and efficient.

Tell us about your structural vibration measurement task and we'll provide the scanning vibrometer solution for frequencies from DC up to 24 MHz and vibrational velocities of 0.02µm/s up to 20m/s.

As your requirements expand, you can upgrade and enhance your vibrometer step by step. Choose between 1-D (out-of-plane) systems, e.g. for sound radiation measurements, or 3-D vibrometers (complete vibration vector) which provide a three-dimensional data set for conducting modal analysis. For microstructures, we recommend our Micro System Analyser (MSA).

pdf Scanning Vibrometer Press Release (77KB)
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Rotational Vibrometers

Rotational Vibrometers

Technology From: Polytec

Rotational Vibrometers

Warsash Scientific offer High Frequency Vibrometers for ultrasonic applications, Rotational Vibrometers for torsional vibration measurement, In-Plane Vibrometers for transverse (in-plane) vibration measurement, Tri-Axial Vibrometers for simultaneous measurement of vibration along 3 axes and long range systems for remote sensing of velocity and displacement.

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Microscope Based Systems

Microscope Based Systems

Wrasash Scientific offer an innovative line of microscope systems for the measurements of MEMS dynamics and topography.
Technology From: Polytec

Microscope Based Systems

Inspired by the growing variety of Microelectromechanical systems (MEMS), Polytec has developed an innovative line of microscope systems for the measurements of MEMS dynamics and topography.

The MSA-500 Micro System Analyser is the premier, fully-integrated, measurement tool for the analysis and visualisation of structural vibrations and surface topography in micro structures. For wafer-level testing, all systems can easily be mounted onto manual or fully automated probe stations.

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Vibrometer Software

Vibrometer Software

Polytec software provides powerful tools that control the measurement, process data, provide intuitive and animated data visualisation and interface with third-party software for modal analysis, FEM and other applications.
Technology From: Polytec

Vibrometer Software

Polytec software provides powerful tools that control the measurement, process data, provide intuitive and animated data visualisation and interface with third-party software for modal analysis, FEM

Finite Element Method
and other applications.

Key Benefits
  • Participate in the software maintenance program and benefit from the automatic distribution of the latest releases.
  • Download the free Polytec Scan Viewer to display vibration measurement data in Microsoft Office applications or web pages.
  • Download the latest updates for your PSV
    Polytec Scanning Vibrometer
    , VibSoft or PMA
    Planar Motion Analysis
    Software for the best performance of your system.
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Vibrometer Accessories

Vibrometer Accessories

These accessories assure a firm support of your sensor head, provide proper illumination in microscope set-up, and enhance measurement surfaces where reflected signals are weak.
Technology From: Polytec

Vibrometer Accessories

Each application is unique, each measurement is important, each set-up must be correct. Polytec has engineered convenience and flexibility into their accessories to facilitate the use of your vibrometer and its adaptation to almost any measurement application. Designed correctly, these accessories assure a firm support of your sensor head, provide proper illumination in microscope set-up, and enhance measurement surfaces where reflected signals are weak.

Products
  • Tripods
  • Positioning Stages
  • Test Stands
  • Optical Accessories
  • Scanning Vibrometer Accessories
  • Software and Data Acquisition
  • Surface Preparation
  • Miscellaneous
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MEMS Dynamics & Topography


Topography (White Light Interferometry)

Topography (White Light Interferometry)

A large vertical range and nanometre resolution means they are ideal tools for determining flatness, height differences and parallelism of large surfaces and structures, including soft materials.
Technology From: Polytec

Topography (White Light Interferometry)

Polytec is addressing the surface metrology market with innovative, high-precision 3-D profilometer technology that works on rough, smooth and stepped surfaces without contact. These products are based on scanning white-light interferometry, also called coherent or vertical scanning interferometry or coherence radar. With their large vertical range and nanometre resolution, they are ideal tools for determining flatness, height differences and parallelism of large surfaces and structures, including soft materials.

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Surface Metrology

Surface Metrology

The AVT-1000 Advanced Vibrometry Tester enables you to measure all critical parameters such as roughness, waviness, and defects across the whole surface of the sample providing important information for process optimisation.
Technology From: Polytec

Surface Metrology

Hard disk drives are manufactured with nanometre precision. The slightest change in manufacturing can cause surface roughness variations large enough to cause failures in the field. For the best yields it is necessary to optimise your process. Measuring and understanding the characteristics of your product allows continuous improvement.

The AVT-1000 Advanced Vibrometry Tester enables you to measure all critical parameters such as roughness, waviness, and defects across the whole surface of the sample providing important information for process optimisation. No other technique can give you such precise, quick, and full surface measurement results.

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Microsystem & MEMS Analysers

Microsystem & MEMS Analysers

Polytec has developed an innovative line of microscope-based systems to measure the dynamics and topography of microsystems and MEMS devices.
Technology From: Polytec

Microsystem & MEMS Analysers

Inspired by the need to characterise the dynamics of the growing variety of micro-electromechanical systems (MEMS), Polytec has developed an innovative line of microscope-based systems to measure the dynamics and topography of microsystems and MEMS devices.

The MSA-500 Micro System Analyser is the premier measurement tool for the analysis and visualisation of structural vibrations and surface topography in microstructures. For wafer-level testing, most systems can easily be mounted onto manual or automated probe stations.

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SAW & RF MEMS Analysers

SAW & RF MEMS Analysers

Complete with a new optical design, the instrument retains the advantages and features familiar to laser vibrometer users.
Technology From: Polytec

SAW & RF MEMS Analysers

The UHF-120 Vibrometer can characterise the out-of-plane vibrations at ultra-high frequencies, extending the vibration frequency bandwidth up to 1.2GHz. Complete with a new optical design, the instrument retains the advantages and features familiar to laser vibrometer users.

The system consists of a heterodyne interferometer with a controller box. The optical head provides a heterodyne detector signal that is acquired with a fast digital oscilloscope. The digitized detector signal is transferred to a PC where the heterodyne carrier is demodulated by a new software module in Polytec's Vibsoft package.

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Stress & Strain Measurement


Dynamic Stress & Strain Measurements

Dynamic Stress & Strain Measurements

The test set-up is fast and very repeatable with no mass loading from an attached transducer.
Technology From: Polytec

Dynamic Stress & Strain Measurements

Understanding the origin of the stress and strain distribution is crucial to increasing the durability of components under dynamic load. Numerical simulations based on finite element (FE) models help with this understanding but must be validated by real component data. Polytec's 3-D Scanning Laser-Doppler Vibrometer with StrainProcessor provides an advanced, non-contact optical test solution.

Polytec's StrainProcessor is a measurement extension developed for easy FE

Finite Element
model updating and for comparisons to calculated stress and strain distributions. It comprises a set of hardware and software components enabling a PSV-400-3D Scanning Vibrometer — a well established tool for full-field non-contact vibration mapping — to measure and analyse the dynamic strain and stress distribution on surfaces with high resolution and low noise.

The Scanning Vibrometer makes a series of non-contact deflection measurements on a predefined grid using the laser probe to characterise strain at each point instead of attaching individual strain gauges. Thus, the test set-up is fast and very repeatable with no mass loading from an attached transducer. Tests are fast and avoid the high cost of preparing and instrumenting the sample with strain gauges.

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All products and information are subject to change without notice.