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ACMM23 | ICONN2014

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Photonic Professional from Nanoscribe


Conference Information

Representatives

Brett Delahunty B.Tech. (Optoelectronics)
Director - Sales & Marketing, Warsash Scientific

Richard Vincent B.Sc. (Biochemistry); P.H.E.D.
Product Manager, Warsash Scientific

Dr Sadik Halizovic PhD (Electrical Engineering)
CEO, Zurich Instruments

Sofia Rodriguez Dipl.-Phys.
Sales Manager, Nanoscribe

Contact
+61 2 9319 0122
sales@warsash.com.au

Conference Details

ACMM23 | ICONN2014
23rd Australian Conference on Microscopy and Microanalysis and the 2014 International Conference on Nanoscience and Nanotechnology

02 - 06 February 2014
Booth 13 & 14, Adelaide Conference Centre, North Terrace, Adelaide SA

www.aomevents.com/ACMMICONN


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3D Laser Lithography

Photonic Professional

Photonic Professional

Designed for the high demands of three-dimensional photonic crystal structures, the instrument is suitable for generating three-dimensional scaffolds for biology, micro- and nanofluidic circuitry and more.
Technology From: Nanoscribe

Photonic Professional GT

With the state-of-the art Photonic Professional GT system, the fabrication of large area 3D micro- and nanostructures is now feasible in a one step process. In combination with an intelligent software package, the system is fully embedded in a typical 3D printing workflow and offers the ease of use known from conventional 3D printing.

Both, additive as well as subtractive manufacturing of photosensitive polymers on a broad range of substrates is possible. These polymers are compatible with typical electroplating and gas-phase deposition processes, allowing the printed parts to coated or transferred into other materials such as gold, nickel, copper (and alloys thereof) as well as silicon or titanium dioxide.

Applications

Photonic Professional GT systems are the drivers of innovation for numerous key technologies. They can be used for a broad range of applications;

  • Micro rapid prototyping
  • Micromachines
  • Medical engineering
  • Micro-optics
  • MEMS
Photonic Professional
3D plasmonic structure.
Nanoscribe Photo
3D mechanical meta material structure.
Nanoscribe Photo
3D fabricated structures for life sciences.
Nanoscribe Photo
3D micro-optic fabricated structures.
Nanoscribe Photo
3D microfluidic filter structure.


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Lock-in Amplifiers


UHFLI Lock-in Amplifier

UHFLI Lock-in Amplifier

This product is a dream come true for many scientists forced to implement their own hardware instead of focusing on research.
Technology From: Zurich Instruments

UHFLI Lock-in Amplifier

The UHFLI is a digital lock-in amplifier covering the frequency range from DC to 600 MHz. In addition to providing the highest operation frequency amongst all commercial lock-in amplifiers, the UHFLI also offers the lowest time constant of 30 ns for demodulation, resulting in a demodulation bandwidth of more than 5 MHz. The exquisite analog front end offers a spectacular noise performance of 4 nV/vHz which helps in many applications to keep the signal-to-noise ratios high while speeding up the measurement. In combination with the most innovative instrument control software LabOne®, the UHFLI is the flagship of all Zurich Instruments products and represents the state of the art of today's scientific instrumentation.

Key Features
  • 600 MHz operation
  • 2 independent lock-in units
  • 2 high-performance signal generators
  • 4 independent harmonics per lock-in unit
  • High-resolution 12-bit scope with 65k samples
  • Frequency Response Analyzer (FRA)
  • FFT Spectrum Analyzer with 5 MHz span
  • LabOne® toolset
Applications
  • Engineering R&D: Oscillator testing, FFT Spectrum Analyzer, Frequency Response Analyzer (FRA), Vector Network Analyzer (VNA)
  • Industrial production: Chip Testing, Failure Analysis, RFID transmission demodulator, Laser Voltage Prober (LVP), Non-Destructive Testing (NDT)
  • Laser spectroscopy, confocal microscopy: ultra-high speed scanning, THz spectroscopy
  • Medtech: flow cytometry, electrical impedance spectroscopy
  • Quantum amp; Nano physics: MRFM, single electron transistors, quantum computing, noise measurement, graphene
  • Scanning probe microscopy: high-speed AFM, scanning near-field optical microscopy (SNOM)
  • Sensors & Actuators: MEMS, NEMS (eg. gyroscopes, accelerometers, etc.)
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Sticker
HF2LI Lock-in Amplifier

HF2LI Lock-in Amplifier

The HF2LI is a technology milestone in both the support of existing applications and in the enabling of the development of many new ones.
Technology From: Zurich Instruments

HF2LI Lock-in Amplifier

The HF2LI is an advanced digital lock-in amplifier with an extended signal frequency range of 50 MHz. With its 2 physical input channels, it replaces 2 traditional lock-in amplifiers for measurement setups. The 128-bit digital signal processing delivers superior precision thus boosting both the noise performance and the dynamic reserve. With these unprecedented capabilities, the HF2LI brings lock-in amplification to a new level and enables new applications in a frequency range that was previously tied to analog instrumentation.

Key Features
  • 2 independent lock-in units, 2 signal generators
  • 1 fundamental and 2 harmonic frequencies per lock-in unit
  • 1 µHz - 50 MHz frequency range
  • 210 MSample/s, 14 bit A/D conversion
  • 5 nV/√Hz input voltage noise
  • 1 µs - 500 s time constant
  • 6 to 48 dB/oct filter slope (1st to 8th order)
  • 4x 1 MSample/s, 16 bit, ±10 V auxiliary analog output
  • 2x 400 kSample/s, 16 bit, ±10 V auxiliary analog input
  • USB 2.0 high-speed host connection
  • LabOne® toolset: Scope, Sweeper, Spectrum Analyzer, etc.
Applications
  • Atomic Force Microscopy (AFM), Scanning Probe Microscopy (SPM)
  • Non-linear imaging (CARS, SRS, Terahertz, etc.)
  • Sensors & Actuators, MEMS, eg. gyroscopes and accelerometers
  • Laser Spectroscopy
  • Astronomy
  • Nondestructive Testing (NDT)
  • Med-tech, Radiology and Ultrasound
  • Industrial processing
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Impedance Spectroscopy


HF2IS Impedance Spectroscope

HF2IS Impedance Spectroscope

This instrument satisfies the highest requirements of today's research laboratories.
Technology From: Zurich Instruments

HF2IS Impedance Spectroscope

The HF2IS is an instrument solution for impedance spectroscopy. Two differential measurement units with a wide frequency range and 4 dual-phase demodulators, are matched with the unprecedented accuracy of a 128-bit DSP engine. This instrument satisfies the highest requirements of today's research laboratories.

Key Features
  • 2 measurement units with single-ended and differential support
  • 1 µHz - 50 MHz analog bandwidth
  • 210 MSample/s, 14 bit A/D conversion
  • 4 frequencies simultaneously (8 with HF2IS-MF)
  • 5 nV/√Hz input voltage noise
  • 1 µs - 500 s time constant
  • 6 to 48 dB/oct filter slope (1st to 8th order)
  • 4x 1 MSample/s, 16 bit, ±10 V auxiliary analog output
  • 2x 400 kSample/s, 16 bit, ±10 V auxiliary analog input
  • USB 2.0 high-speed host connection
  • Included oscilloscope and frequency response sweeper
  • Included graphical user interface and driver software
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Raman Spectroscopy

inVia Raman Microscope

inVia RAMAN MICROSCOPE

The Renishaw inVia Raman spectrometer is globally recognised as the industry leader for ease-of-use, sensitivity, function and flexibility.


inVia Raman Microscope

Image courtesy of Renishaw

Raman spectroscopy reveals the vibrations of molecules and crystals. With this information you can identify substances, and also determine other valuable details, such as the level of stress in crystals or semiconductors, the quality and the quantitative depth of a coating or film.


inVia Raman Microscope

Image courtesy of Renishaw

StreamLine Raman image of a mollusc shell. This image has been modified for this website. Please contact Warsash Scientific to view original StreamLine images.
Technology From: Renishaw

inVia Raman Microscope

The Renishaw inVia Raman microscope is Australia's premier Raman spectrometer for research and industry, comprising a research-grade optical microscope coupled to a high-performance Raman spectrometer. Researchers tackling the most challenging analytical problems rely on the proven high performance, versatility, and flexibility of inVia microscopes.

One single instrument delivers both highly-specific discrete analyses, and information-rich chemical images across the broadest range of material types. It is rapid, non-destructive, and does not require invasive chemical labels. It is intuitive and easy to use, ideal for spectroscopists and non-spectroscopists alike. Raman spectroscopy reveals the vibrations of molecules and crystals. With this information you can identify substances, and also determine other valuable details, such as the level of stress in crystals or semiconductors, the quality and the quantitative depth of a coating or film.

Key Features of Raman Spectroscopy
  • Non-contacting and non-destructive analysis
  • Experiments are fast because little or no sample preparation is required
  • You can analyse samples contained within most transparent containers, and in aqueous solution
  • You can routinely study particles as small as 1µm
Key Features of inVia Raman Spectrometer
  • ∼1cm-1 spectral resolution
  • 0.05cm-1 repeatability
  • 1-2µm spatial resolution (wavelength and objective dependent)
  • High throughput/efficiency imaging spectrometer design
  • Novel patented design features
  • Continuously variable laser spot from 1 - 300µm
  • SyncroScan continuous extended scanning
  • 100nm step, high speed encoded XYZ stage
  • StreamLine Raman high speed imaging capability with 250nm spatial resolution (StreamLine HR)
  • The ability to add multiple excitation wavelengths
  • Combined analytical techniques such as Raman-SEM and Raman-AFM

The inVia "Reflex" system offered features full automation for ease of use in a multi-user environment, including motorised beam steering mirrors and pinholes for autonomous self-alignment and maintenance, slits for auto-confocal mode operation and spectrometer optics for multiple excitation wavelengths.

The inVia Reflex Raman microspectrometer is self-validating with built-in calibration sources and can be remotely operated for support. The inVia also supports IQ/OQ

Installation Qualification, Operational Qualification
instrument validation, password protects, file logs, and instrument and enclosure locks suitable for forensic science and pharmaceutical security purposes and standard operating procedures. The system is available with Class 1 laser safe enclosures and is fully enclosed laser paths for multiple lasers and full interlocked with interlock self-test features. Renishaw is an ISO 9001:2008 quality certified company.

The Renishaw inVia Raman spectrometer is globally recognised as the industry leader for ease-of-use, sensitivity, function and flexibility.

pdf Raman Spectroscopy Overview (161KB)
pdf Article: Breakthrough Graphene Research (129KB)
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Raman-AFM

Raman-AFM

The efficiency and stability at the core of the inVia Raman microscope, and the inherent flexibility it offers by design, makes it the perfect platform for integration.
Technology From: Renishaw

Raman-AFM

Renishaw identified and pioneered the combination of atomic force microscopy (AFM) with Raman scattering on a single platform and now celebrates its 10th year supplying combined Raman-AFM

Atomic Force Microscope
systems to the research and academic communities. Raman spectroscopy provides the perfect complement for AFM measurements as it provides detailed chemical information about the sample, something that is missing from the array of imaging modes of AFMs.

The efficiency and stability at the core of the inVia Raman microscope, and the inherent flexibility it offers by design, makes it the perfect platform for integration. This allows researchers to use their preferred AFM of choice to probe nanostructures to extract vital material components, and to perform tip-enhanced Raman spectroscopy (TERS) with spatial resolutions approaching 10nm.

The Renishaw inVia Raman spectrometer integrates to a wide range of commercial AFM manufacturers including Park, Bruker, Nanonics, NT-MDT and JPK.

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Atomic Force Microscopes

NX10

NX10

The NX10, the world's most accurate AFM, brings unparalleled imaging accuracy, scan speeds, and tip life to the next generation of researchers.
Technology From: Park Systems

NX10

The NX10, the world's most accurate AFM

Atomic Force Microscope
, brings unparalleled imaging accuracy, scan speeds, and tip life to the next generation of researchers, all at an affordable price. It is the world's premium research-grade True Non-Contact AFM, featuring industry-leading Z-servo speed, XYZ scanner linearity, closed-loop detector noise, and minimised thermal drift. As a user-friendly AFM, the NX10 makes AFM convenient and intuitive for new and experienced users alike.

Key Features
  • Accurate AFM Imaging by Crosstalk Elimination
  • Industry leading XYZ scan linearity with two independent flexure scanners for sample and tip
  • Best out-of-plane motion of less than 1nm over entire XY scan range
  • Z scanner linearity of less than 0.015%
  • Reduced XY scanner ringing by forward sine-scan algorithm
  • Accurate AFM Scan by True Non-Contact Mode™
  • Industry leading Z-scanner bandwidth of more than 9kHz, or Z-servo speed of more than 62mm/sec tip velocity
  • Fastest scan speed in non-contact mode imaging
  • Less tip wear for prolonged high-quality scans
  • Minimised sample damage or modification
  • Accurate AFM Measurement by True Sample Topography™
  • Sample topography measured by industry leading low noise Z detector
  • Industry leading, small forward and backward scan gap of less than 0.15%
  • Minimised system drift and hysteresis by thermally matched components
  • Active temperature control of acoustic enclosure
  • NX User Productivity
  • Easy tip exchange with wide open side access to the tip and sample
  • Easy, intuitive laser alignment with pre-aligned tip mount and patented on-axis, top down view
  • Fast automatic tip approach to sample surface within 10 seconds
  • 24 bit digital electronics with three internal lock-ins, Q-control, and spring constant calibration
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Film Thickness Measurement

aRTie Thin Film Measurement

aRTie

aRTie represents a breakthrough in spectral reflectometer affordability and ease-of-use.
Technology From: Filmetrics

Spectral Reflectance & Transmittance Measurement

aRTie from Filmetrics represents a breakthrough in spectral reflectometer affordability and ease-of-use. Time consuming reference readings and minutes-long lamp warm-ups are a thing of the past. Simply plug aRTie into your computer's USB port and you're ready to go. aRTie's 40,000-hour light source and on-board spectroscopic calibration mean that maintenance is nil and measurement confidence is high.

Key Features
  • Reference and background steps are not required
  • Powered through USB cable - no other connections or set up required
  • Start the software and in 10 seconds aRTie is ready to go
  • 40,000-hour light source
  • Automatic on-board wavelength calibration
  • Measures spectral R, T, R+T, A(=1-R-T), and colour of flat specular samples
  • Film thickness and refractive index analysis optional
  • 380-1050nm wavelength range
  • UV and NIR versions coming soon
pdf aRTie Press Release (50KB)
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Sticker
Single Spot Measurements

Single Spot Measurements

Warsash Scientific offer a range of Table Top Systems for measuring film thickness and refractive index with a single mouse click.
Technology From: Filmetrics

Single Spot Measurements

Warsash Scientific offer a range of Table Top Systems for measuring film thickness and refractive index with a single mouse click, enabling thickness measurements from 1nm to 3.5mm, even within multilayer film stacks.

Products
  • F20: The world's best-selling table top film thickness measurement system. Available with a wide range of accessories and thickness coverage
  • F10-RT: Measures reflectance and transmittance simultaneously. Options available for thicknesses and index measurement
  • F10-AR: Measures reflectance of ophthalmic lenses and other curved surfaces. Options available for transmittance and hardcoat thickness measurement
  • PARTS: Measures complex film stacks by combining Perpendicular and Angled Reflectance, Transmittance and Scatterometry
  • F10-HC: Measures hardcoat and anti-fog film thickness and index. Popular in automotive and other industries that hardcoat polycarbonate
  • F10-PA: Provides hands-free parylene thickness measurement
  • F70: Measure the thickness of any transparent material up to 3.5mm thick
pdf Press Release F70 Transparent Film Measurement (65KB)
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Microscope - Spot Measurements

Microscope - Spot Measurements

These products are used when a measurement spot as small as 2.5µm is required.
Technology From: Filmetrics

Microscope - Spot Measurements

These products are used when a measurement spot as small as 2.5µm is required. Instrumentation can be adapted to an existing microscope or we can supply an entire system.

Products
  • F40: Attaches to an existing microscope to measure thickness and index in spots as small as 2.5µm
  • F40-UV: Measures films down to 4nm thick
  • F40-NSR: Integrates seamlessly onto your NanoSpec™ 180/210 System
  • F42: Provides 2-D thickness maps with sub-micron grid spacing
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Automated Mapping Systems

Automated Mapping Systems

Warsash Scientific source instrumentation for fully-automatic mapping of thickness and index for nearly any sample shape.
Technology From: Filmetrics

Automated Mapping Systems

Warsash Scientific source instrumentation for fully-automatic mapping of thickness and index for nearly any sample shape. Manual-load and robotic-load systems are also available.

Products
  • F50: Adds automated mapping capabilities to the F20 family of products. Map thickness and index as fast as two points per second
  • F60-t: Production-ready table top thickness mapping system includes on-board reference, notch finding, interlocked cover and more
  • F60-c: Cassette-to-cassette version of the F60-t. Supports up to 300mm wafers
  • F80-t: Production-ready table top patterned wafer thickness mapping system, capable of 15-points in 21 seconds
  • F80-c: Cassette-to-cassette version of the F80-t. Supports up to 300nm wafers
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Inline Monitoring

Inline Monitoring

Inline monitoring allows you to monitor and control thickness of moving films during production.
Technology From: Filmetrics

Inline Monitoring

Inline monitoring allows you to monitor and control thickness of moving films during production. Sample rates as high as 100 Hz are possible at multiple measurement locations.

Products
  • F30: Monitor reflectance, thickness and deposition rates during MOCVD, sputtering and virtually any other deposition process
  • F37: Monitors reflectance, thickness and deposition rates at up to seven locations simultaneously
  • Send Enquiry

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Microscopy Products

PInano Cap XY(Z) Piezo System

PInano® Cap XY(Z) Piezo System

This system features significantly improved stability and repeatability compared to piezoresistive sensors.
Technology From: PI (Physik Instrumente)

PInano® Cap XY(Z) Piezo System

Key Features
  • Highest stability and repeatabilily
  • Travel ranges up to 200 x 200 x 200µm
  • Sub-nanometer resolution
  • ms-response times
  • Low Profile for easy integration: 20mm
  • Recessed slide holder, free rotation of turret
pdf PI Microscopy Brochure (1.54MB)
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PInano XY(Z) Piezo System

PInano® XY(Z) Piezo System

These products feature a high-dynamics system with millisecond response times.
Technology From: PI (Physik Instrumente)

PInano® XY(Z) Piezo System

Key Features
  • Cost-effective design due to piezoresistive sensors
  • Travel ranges up to 200 x 200 x 200µm
  • Low profile for easy integration: 20mm
  • Large clear aperture for 3x1" object slides, recessed sample holders
  • Outstanding lifetime due to PICMA® piezo actuators
  • Sub-nanometer resolution, ms-response times
pdf PI Microscopy Brochure (1.54MB)
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PInano Trak Piezo Tracking System

PInano® Trak Piezo Tracking System

This tracking system features closed-loop control for high repeatability and accuracy, good positional stability and a cost-effective design.
Technology From: PI (Physik Instrumente)

PInano® Trak Piezo Tracking System

Key Features
  • Fast response < 5 ms with sub-nanometer resolution: ideal for tracking
  • Travel ranges up to 70 x 70 x 50µm
  • Low profile for easy integration: 20mm
  • Recessed slide holder, free rotation of turret
pdf PI Microscopy Brochure (1.54MB)
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Open-Frame Microscope Stage

Open-Frame Microscope Stage

Stiff design enables optimal scanning and settling behavior.
Technology From: PI (Physik Instrumente)

Open-Frame Microscope Stage

Key Features
  • Stable platform for P-545
  • PInano® piezo nanopositioning systems
  • Low profile for easy integration: 30mm
  • Travel range 25 x 25 mm
  • Micrometer screws, motor upgrade available
  • For inverted microscopes made by Nikon, Zeiss, Leica and Olympus
pdf PI Microscopy Brochure (1.54MB)
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Microspectrophotometry


20/30 PV Microspectrophotometer

20/30 PV™ Microspectrophotometer

This bespoke instrument incorporates the latest technological advances in optics, spectroscopy and software to deliver the superior performance with unparalleled speed and capabilities.
Technology From: CRAIC

20/30 PV™ Microspectrophotometer

The 20/30 PV™ microspectrophotometer combines the latest technologies to allow the user to measure UV-visible-NIR range transmission, absorbance, reflectance, emission and fluorescence spectra of sample areas smaller than a micron across. Even the thickness of thin films and colour spaces may be determined. And while microspectra™ are being acquired, the sample may be viewed with high-resolution digital imaging in the deep UV, in colour or in the near infrared. Ease of use features also add to the power of the 20/30 PV system and include everything from improvements in the instruments ergonomics to software to automation.

The 20/30 PV microspectrophotometer is simple to use, the measurements are non-destructive and the spectral data is unmatched. This bespoke instrument incorporates the latest technological advances in optics, spectroscopy and software to deliver the superior performance with unparalleled speed and capabilities.

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20/30XL Microspectrophotometer

20/30XL™ Microspectrophotometer

The 20/30 XL™ microspectrophotometer integrates advanced spectrophotometers with a sophisticated UV-visible-NIR range microscope and powerful, easy-to-use software.
Technology From: CRAIC

20/30XL™ Microspectrophotometer

The 20/30 XL™ is able to take spectra and images of microscopic features of very large objects from the deep UV to the near infrared. There is no upper limit to the sample size which makes this instrument perfect for everything from quality control of the largest flat panel displays to film thickness of 300mm wafers to the non-destructive analysis of great artworks.

The 20/30 XL microspectrophotometer is designed to non-destructively analyse microscopic features of very large samples when integrated into large scale sample handling machinery. With a spectral range from the deep ultraviolet to the near infrared, analysis of samples can be done by absorbance, reflectance, Raman, luminescence and fluorescence with unparalleled speed and accuracy. The system can also be configured to image microscopic sample areas in the UV and NIR regions in addition to high resolution colour imaging.

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FLEX™ UV-Visible-NIR Microspectrophotometer

FLEX™ UV-Visible-NIR Microspectrophotometer

The FLEX™ microspectrophotometer is built to yield superior quality images and spectra for an attractive price.
Technology From: CRAIC

FLEX™ UV-Visible-NIR Microspectrophotometer

FLEX™ is a full-featured yet flexibly configured instrument that incorporates UV-visible-NIR optics, spectrophotometers digital imaging, and software, all tied together with a Lightswitch by CRAIC™ optical multiplexer. With Lightswitch technology, FLEX retains the ease-of-use, while being capable of everything from UV-visible-NIR microspectroscopy, high resolution microscopic imaging, refractive index measurements and more.

With an attractive price-entry point, the FLEX microspectrophotometer utilises tested technologies to allow you to measure UV-visible-NIR range transmission, absorbance, reflectance, emission and fluorescence spectra of microscopic sample areas. And while microspectra™ are being acquired, the sample may be simultaneously imaged with a high-resolution colour digital imaging system or through eyepieces. Additional features may also include measuring the refractive index of microscopic samples as well as microcolourimetry and microspot thin film thickness measurements.

The FLEX™ microspectrophotometer is built to yield superior quality images and spectra for an attractive price.

Key Features
  • UV-visible-NIR transmission microspectroscopy
  • UV-visible-NIR transmission imaging
  • UV-visible-NIR reflectance microspectroscopy
  • UV-visible-NIR reflectance imaging
  • UV-visible-NIR fluorescence microspectroscopy
  • UV-visible-NIR fluorescence micro-imaging
  • Raman microspectroscopy
  • Thin film thickness measurements
  • Colourimetry of microscopic samples
  • Refractive index measurements with the rIQ™ package
  • Integrated TE cooled array detectors for low noise and long term stability
  • Calibrated, variable measurement areas even smaller than a micron
  • Superior images both with eyepieces and digital imaging
  • Specialised software including statistical analysis, spectral databasing, image analysis and more
  • Easy to use and maintain
Send Enquiry

508 PV™ UV-Vis-NIR Spectrophotometer

508 PV™ UV-Vis-NIR Spectrophotometer

The 508 PV™ Microscope Spectrophotometer is designed to add spectroscopy, colour imaging, thin film thickness measurement and colourimetry capabilities to your optical microscope or probe station.
Technology From: CRAIC

508 PV™ UV-Vis-NIR Spectrophotometer

The 508 PV™ Microscope Spectrophotometer is designed to add spectroscopy, colour imaging, thin film thickness measurement and colourimetry capabilities to your optical microscope or probe station. It can also be used to upgrade an older microspectrometer with cutting edge optics, electronics and software.

The 508 PV attaches to an open photoport and enables you to collect transmission, reflectance, polarization or even fluorescence and luminescence spectra of microscopic samples. Featuring Lightblades™, the 508 PV spectrophotometer has a usable spectral range from the ultraviolet to the near infrared. With the 508 PV, you can acquire high quality spectra of even sub-micron samples rapidly, non-destructively and with ease.

The 508 PV Microscope Spectrophotometer is ideal for diverse applications such as colourimetry of pixels on flat panel displays, reflectometry of vitrinite coal and source rock, or thin film thickness measurements of optics and semiconductors. The 508 PV is also a cost effective way to upgrade older microspectrometers to the latest hardware and software.

Key Features
  • Featuring Lightblades™ spectrophotometers designed specifically for microspectroscopy
  • User selected spectral range from deep UV to NIR
  • 250 to 2100nm available spectral range
  • Permanently calibrated, variable measurement areas even below a micron
  • Thermoelectric cooling available to improve signal-to-noise ratios and long term stability
  • Incorporates high resolution, colour digital imaging. Up to 6 megapixels available
  • Featured with Lambdafire™ spectroscopy and imaging control and analysis software. Lambdafire also includes touchscreen control
  • Calibrated, variable measurement areas even smaller than a micron
  • Transmission microspectroscopy
  • Reflectance microspectroscopy
  • Fluorescence microspectroscopy
  • Polarization microspectroscopy
  • Thin film thickness measurements
  • Colourimetry of microscopic samples
  • Refractive index measurements with the rIQ™ package
  • Manual or fully automated operation
  • Precision temperature control of samples
  • Specialized software including statistical analysis, spectral databasing, image analysis and more
  • NIST traceable microspectrometer standards
  • Easy to use and maintain
  • From the experts in microspectroscopy
Send Enquiry

308 PV™ Microscope Spectrophotometer

308 PV™ Microscope Spectrophotometer

The 308 PV™ attaches to an open photoport and enables you to collect transmission, reflectance, polarisation or even fluorescence and luminescence spectra of microscopic samples.
Technology From: CRAIC

308 PV™ Microscope Spectrophotometer

The 308 PV™ Microscope Spectrophotometer is designed to add spectroscopy, colour imaging, thin film thickness measurement and colourimetry capabilities to your optical microscope or probe station. It can also be used to upgrade an older microspectrometer with cutting edge optics, electronics and software.

The 308 PV attaches to an open photoport and enables you to collect transmission, reflectance, polarisation or even fluorescence and luminescence spectra of microscopic samples. Featuring Lightblades™ spectrophotometer technology, the 308 PV spectrophotometer has a usable spectral range from the ultraviolet to the near infrared. With this instrument, you can acquire high quality spectra of even sub-micron samples rapidly, non-destructively and with ease.

The 308 PV Microscope Spectrophotometer is ideal for diverse applications such as colourimetry of pixels on flat panel displays, reflectometry of vitrinite coal and source rock, or thin film thickness measurements of optics and semiconductors. The 308 PV is also a cost effective way to upgrade older microspectrometers to the latest hardware and software.

Key Features
  • Uses Lightblades™ spectrophotometers designed specifically for microspectroscopy
  • User selected spectral range from deep UV to NIR
  • 250 to 2100 nm available spectral range
  • Permanently calibrated, variable measurement areas even below a micron
  • Thermoelectric cooling available to improve signal-to-noise ratios and long term stability
  • Incorporates high resolution, colour digital imaging — up to 6 megapixels available
  • Advanced MINERVA™ spectral analysis software
  • Advanced ImageUV™ image analysis software
  • Calibrated, variable measurement areas even smaller than a micron
  • Transmission microspectroscopy
  • Reflectance microspectroscopy
  • Fluorescence microspectroscopy
  • Polarisation microspectroscopy
  • Thin film thickness measurements
  • Colourimetry of microscopic samples
  • Refractive index measurements with the rIQ™ package
  • Manual or fully automated operation
  • Precision temperature control of samples
  • Specialised software including statistical analysis, spectral databasing, image analysis and more
  • NIST traceable microspectrometer standards
  • Easy to use and maintain
Send Enquiry

CRAIC MP-2™ Microscope Photometer

MP-2™ Microscope Photometer

The CRAIC MP-2™ Microscope Photometer is designed to add photometry and imaging to your optical microscope. It is limited only by the microscope itself.
Technology From: CRAIC

MP-2™ Microscope Photometer

The MP-2™ Microscope Photometer is designed to add photometry and imaging to your optical microscope. It is better described as a microscope radiometer in that it has a spectral range from the deep UV to the near infrared. It is limited only by the microscope itself.

This microphotometer attaches to your microscope and enables you to collect transmission, reflectance or even fluorescence and luminescence photometric data of microscopic samples. The solid state detectors have dynamic ranges and sensitivities greater than PMTs or imaging systems. With complete software control, either broad- or narrow-band photometric intensity measurements can be made. Additionally, with the use of reference materials, precise photometric intensities can be recorded relative to the reference material. With the MP-2 microphotometer, high quality photometry of even sub-micron samples can be done quickly, non-destructively and easily.

Key Features
  • Sensitive detector for low noise and long term stability
  • Total spectral range from deep UV to NIR with the specific range selected by the user
  • Rapid radiometric measurement capabilities
  • High dynamic range and high sensitivity
  • High spatial resolution and stray light resistance
  • Variable measurement areas down to sub-micron
  • Also incorporates high resolution digital imaging — up to 6 megapixels
pdf MP-2™ Press Release
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Microscopes


UVM-1™ Ultraviolet Microscope

UVM-1™ Ultraviolet Microscope

The UVM-1™ is a UV microscope that also can image in the visible and NIR.
Technology From: CRAIC

UVM-1™ Ultraviolet Microscope

The UVM-1™ is a UV microscope that also can image in the visible and NIR. This UV-visible-NIR microscope embodies both advanced optics for cutting edge UV, colour and NIR imaging and visualisation. The system is a flexible design, very easy to use and very durable. It is designed with cutting edge CRAIC optics for the highest image quality and to give years of service.

The UVM-1 UV microscope can image in transmission, reflectance, polarisation and even in fluorescence from the UV, visible, and NIR regions with high spatial resolution, all with the same microscope and without swapping components.

Key Features
  • Deep UV microscopy
  • Visible range microscopy
  • NIR microscopy
  • Ultraviolet-visible-NIR imaging in one shot without changing optics
  • Raman spectroscopy of microscopic samples
  • Transmission, reflectance, fluorescence, and polarisation imaging of microscopic samples
  • True high resolution digital imaging and direct visualisation through eyepieces
  • Easy to use and maintain
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Atomic Layer Deposition (ALD)

Atomic Layer Deposition (ALD)

TFS 200, Atomic Layer Deposition (ALD)

Warsash Scientific offer you a diverse palette of equipment, from pure research tools to industrial production workhorses.


Atomic Layer Deposition (ALD)

Atomic Layer Deposition (ALD)

ALD equipment offers proven excellence in technical performance. Our systems all combine an uncompromisingly high quality of coating with extremely low cycle times.
Technology From: Beneq

Atomic Layer Deposition (ALD)

Today, Beneq represents the uttermost expertise in ALD. Since 2005, they have launched equipment for research, batch production and continuous industrial manufacturing, all incorporating that special quality that makes their equipment worth your while.

ALD equipment offers proven excellence in technical performance. Systems all combine an uncompromisingly high quality of coating with extremely low cycle times.

Warsash Scientific offer you a diverse palette of equipment, from pure research tools to industrial production workhorses. All equipment is planned, designed and manufactured by professionals for professionals.

Application-specific systems focus on certain processes and properties. These systems are the result of in-depth work together with customers aiming for reliable production equipment and a solution for their opportunity.

Product Range
  • TFS 200, for ALD research, including Particle ALD™
  • TFS 200R, for continuous mode ALD research
  • TFS 500, for ALD research and batch production
  • TFS 600, for industrial OLED encapsulation
  • TFS 1200, for industrial in-line integrated CIGS solar cell buffer layer
  • TFS NX300, for industrial fully-automated c-Si solar cell surface passivation
  • P400A and P800, for industrial ALD batch production
  • WCS 500, for roll-to-roll ALD research and production scale-up
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Ti:Sapphire Lasers


SolstTiS CW Ti Sapphire Laser

SolstTiS CW Ti Sapphire Laser

The smallest, lowest noise, and only fully automated, maintenance-free laser of its type.
Technology From: M Squared Lasers

SolstTiS® CW Ti Sapphire Laser

SolsTiS® is an ultra-compact, automated, widely tunable, CW narrow linewidth Ti Sapphire laser system. The smallest, lowest noise, and only turnkey laser of its type, SolsTiS provides a host of next-generation features that lower cost, while maximising reliability, performance and productivity. With up-to-date Digital Signal Processing (DSP) electronics and proprietary InvarianT™ alignment- and drift-free optical mount technology, SolsTiS incorporates a compact laser resonator for high mechanical stability, and simplified tuning and scanning.

SolsTiS provides high output power, broad tuning, and the lowest noise in the industry. Compatible with a wide range of commercial Ti Sapphire pump lasers as well as fully integrated pump options. Available in a range of linewidth options.

Key Features
  • Ultra-compact — smallest, and only alignment-free laser of its type
  • Sealed, rugged design
  • Wide choice of tuning range, linewidth, output power and pump laser options
  • Broad tuning range with one optics set
  • Hands-free wavelength tuning, frequency scanning and locking for increased productivity
  • Unique Instrument Control by Ethernet (ICE)
  • Compatible with all standard Ti:S pump lasers
  • Unique integrated DPSSL
    Diode Pumped Solid State Laser
    pump option
  • Unique InvarianT alignment-free mount technology
  • Netbook control computer, User Interface and compact laser controller supplied as standard
  • Ideal for atom cooling, high-resolution spectroscopy, optical tweezing and holography
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ECD-X Ultra Compact Frequency Module

ECD-X Ultra Compact Frequency Module

The ECD-X is an ultra-compact frequency doubling accessory module that uses resonant enhancement to frequency convert the output of CW narrow linewidth laser sources with high efficiency.
Technology From: M Squared Lasers

ECD-X Ultra Compact Frequency Module

The ECD-X is an ultra-compact frequency doubling accessory that uses resonant enhancement to frequency convert CW narrow linewidth input laser light, such as that from the M Squared 'SolsTiS', with high efficiency. The enhancement technique combines a highly stable doubling cavity with active servo-locking of that cavity to the frequency of the input light. This provides high-efficiency conversion of input power to the second harmonic wavelength. The ECD-X incorporates a host of features designed to maximise doubling efficiency, stability, and flexibility including a highly stable monolithic stainless steel housing with Invar® optical sub-plate; fast, robust cavity locking via the use of high bandwidth DSP control electronics; a miniaturised cavity for longer, faster scans; a wide range of user-changeable mirror/crystal sets and adjustable mode-matching optics to adapt to different input sources; and unique local/remote Instrument Control by Ethernet.

Key Features
  • High-stability monolithic cavity design
  • Unique ultra-compact resonator for faster, longer scans and higher efficiency with broader linewidths
  • Unique Instrument Control by Ethernet (ICE)
  • Up-to-date DSP electronics for high-efficiency enhancement and robust cavity lock
  • Single optics set covers entire Ti:S fundamental range
  • Wavelength flexibility via wide range of doubling crystals
  • Accommodates wide range of input sources via supplied mode-matching optics
  • Simple integration with SolsTiS CW
    Continuous Wave
    Ti:S laser
  • Options for tripling, quadrupling, and mixing
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Sprite Ultra-Fast Laser Series

Sprite Ultra-Fast Laser Series

Sprite provides broad platform flexibility, plus design features that maximise stability, reliability and productivity.
Technology From: M Squared Lasers

Sprite Ultra-Fast Laser Series

The Sprite-t is a widely tunable automated ultrafast Ti:Sapphire laser. Available as a widely tunable fs (XT-F) or ps (XT-P) models or broad bandwidth (XP) for <15 fs with external compression. Fully sealed laser head for alignment free operation.

Key Features
  • Ultra-compact, sealed, rugged design maximises stability
  • Highly flexible platform, with broad factory configuration choice
  • Maintenance-free operation
  • Passive mode-locking and proprietary InvarianT™ mounts maximize reliability
  • Integrated DPSSL
    Diode Pumped Solid State Laser
    pump options
  • Netbook computer and User Interface supplied as standard
  • Ideal for pump-probe experiments, MPE
    Multiphoton Excitation
    microscopy, nonlinear optics, amplifier seeding
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Optical Parametric Oscillators (OPO)


Firefly Mid-IR Laser

Firefly Mid-IR Laser

Available in six standard Firefly-IR models (two output power, two tuning range and two linewidth options), Firefly-IR can be customised if needed.
Technology From: M Squared Lasers

Firefly Mid-IR Laser

Firefly-IR is an innovative, widely tunable, hands-free, mid- and near-infrared laser source that brings new capabilities to a host of molecular spectroscopy, remote sensing and imaging applications.

Firefly-IR offers broad mid-infrared wavelength coverage allowing users to probe the absorption features of many different molecules with a single device. With a rugged, sealed, internal maintenance-free, shoebox-sized optical head, Firefly-IR is available with a choice of several standard configurations. Firefly-IR's high pulse energy and peak power afford greater detection sensitivity and standoff distances.

Key Features
  • Extremely broad tuning range from a single device
  • Class-leading peak and average power increases S:N and detector standoff distance
  • Automated, alignment- and maintenance-free operation
  • High repetition rate enables rapid data acquisition and real-time imaging
  • Highly compact, with integrated pump source
  • Pulse burst modulation option
  • Provides new capabilities for trace gas detection (hydrocarbons, greenhouse gases), threat detection, oil/gas prospecting, molecular spectroscopy, IRCM
    infrared countermeasure
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Firefly THz

Firefly THz

With wide hands-free tuning, a readily collimated output beam, microwatt average powers, and Watt-level peak powers, Firefly-THz opens the door to a new generation of more practical, cost-effective THz sources.
Technology From: M Squared Lasers

Firefly THz

Firefly-THz is a pulsed terahertz (THz) laser source that provides a unique combination of shoebox size, narrow linewidth, nanosecond output pulses (tunable over a wide & continuous range), room temperature operation, and high output power.

Offering high brightness and a practical alternative to other methods for generating THz light, Firefly-THz provides significant advances in the compactness, convenience and efficiency of THz sources, by virtue of its integrated diode-pumped pump laser, sealed alignment-free laser head, and a novel optical parametric oscillator design that produces highly efficient conversion of the pump to THz wavelengths.

Key Features
  • High brightness provides greater sensitivity and standoff distance for remote sensing/spectroscopy
  • Widely tunable, narrow linewidth output enables broad, fast THz wavelength scans from a single unit
  • Automated, hands-free operation and wavelength tuning for increased productivity
  • Pulsed nanosecond output removes the need for post-detection Fourier transform data processing
  • Unique Instrument Control by Ethernet (ICE)
  • Unique InvarianT™ alignment-free mounts
  • Netbook control computer, software User Interface and compact laser controller supplied as standard
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Lasers

Ultra-Low Noise CW DPSS

Ultra-Low Noise CW DPSS WITH CONTROLLER

The UV-visible-NIR lasers are single-frequency lasers with high level of stability, ultra-low noise, very narrow spectral bandwidth and a perfect quality beam over a wide range of operation temperatures.
Technology From: Cobolt

Ultra-Low Noise CW DPSS

Power Output: Up to 2000mW
Wavelengths: 355nm, 532nm, 561nm, 660nm, 1064nm

The 05-01 Series lasers are continuous wave (CW) diode-pumped solid-state (DPSS). The UV-visible-NIR lasers are single-frequency lasers with high level of stability, ultra-low noise, very narrow spectral bandwidth and a perfect quality beam over a wide range of operation temperatures. The lasers are based on proprietary PPKTP technology which provides improved power efficiency, large wavelength flexibility and multi-line emission possibility.

Key features
  • Single frequency, high power DPSS lasers
  • CW power up to 2000 mW in a perfect beam
  • Ultra-robust, hermetically sealed packages
  • Ultra-low noise, <0.25% rms
  • Immunity to optical feedback
  • Available wavelengths: 355nm, 532nm, 561nm, 660nm and 1064nm
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Low Noise CW DPSS

Low Noise CW DPSS WITH CONTROLLER

The lasers are based on proprietary PPKTP technology which provides improved power efficiency, large wavelength flexibility and multi-line emission possibility.
Technology From: Cobolt

Low Noise CW DPSS

Power Output: Up to 300mW
Wavelengths: 457nm, 473nm, 491nm, 515nm, 532nm, 561nm, 594nm

The 04-01 Series lasers are continuous wave (CW) diode-pumped solid-state (DPSS). The UV and visible lasers are single-longitudinal-mode lasers with high level of stability, low noise, very narrow spectral bandwidth and a perfect quality beam over a wide range of operation temperatures. The lasers are based on proprietary PPKTP technology which provides improved power efficiency, large wavelength flexibility and multi-line emission possibility.

Key features
  • Compact and powerful single longitudinal mode DPSS lasers
  • CW power up to 300 mW in a perfect beam
  • Ultra-robust, hermetically sealed packages
  • True fibre pigtailed option
  • Low noise, <0.25% rms
  • Available wavelengths: 457nm, 473nm, 491nm, 515nm, 532nm, 561nm and 594 nm
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High Performance Fixed Wavelength

High Performance Fixed Wavelength

These lasers offer optimum beam quality and modulation performance from a small and compact package.
Technology From: Cobolt

High Performance Fixed Wavelength

Power Output: Up to 250mW
Wavelengths: 405nm, 445nm, 473nm, 488nm, 515nm, 638nm, 660nm

06-01 Series lasers consist of high performance fixed wavelength diode laser modules covering a spectral range between 405 and 660nm. The lasers offer optimum beam quality and modulation performance from a small and compact package. Manufacturing using unique HTCure™ Technology ensures world-class quality reliability and lifetime, as well as unmatched robustness.

Key Features
  • Easy-to-integrate compact and powerful laser diode modules
  • Wavelengths: 405nm, 445nm, 473nm, 488nm, 515nm, 638nm, 660nm
  • Power up to 250mW in a high-quality beam
  • Direct intensity modulation capability: fast and deep modulation from versatile input signals
  • All control electronics fully integrated into laser head
  • Ultra-robust design
  • Fibre pigtailed option
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Light Engine Capabilities

LIGHT ENGINE CAPABILITIES

Excellent beam overlap and beam pointing stability.
Technology From: Cobolt

Light Engine Capabilities

Power Output: 25mW-150mW
Wavelengths: 457nm-594nm

The Dual Combiner™ is a unit which offers any combination of two 04-01 Series lasers at any power level in a permanently aligned package. The extreme robustness of the laser and proprietary HTCure™ manufacturing technology allows Warsash Scientific to offer the Dual Combiner with excellent beam overlap and beam pointing stability.

In the 04-01 Series fibre pigtailed DPSS lasers, the SM/PM fibre is fixed inside a hermetically sealed package using proprietary HTCure™ technology. This results in extremely good output power stability as well as a polarisation extinction ratio.

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Vibration Isolation: Benchtop Platforms

Sticker
ELpF Lightweight Benchtop Vibration Isolation

ELpF LIGHTWEIGHT BENCHTOP VIBRATION ISOLATION

A low-profile, pneumatic vibration-free platform.
Technology From: Kinetic Systems

ELpF Lightweight Benchtop Vibration Isolation

Load Range: 68kg, 136kg max. (150lbs, 300lbs max.)

This lightweight, low-profile pneumatic vibration-free platform is designed to meet the exacting vibration-control requirements of sensitive equipment. A very low profile of only 76mm (3") nom., and light weight of only 18kg (40lbs), makes this an excellent choice for bench top vibration isolation applications. The clean ergonomic design makes this system ideal for use in cleanroom and laboratory environments.

The ELpF lightweight bench top vibration isolation system offers exacting vibration-control requirements for a wide range of applications including atomic force microscopes, microhardness testers, analytical balances, profilometers, audio equipment and other lightweight vibration sensitive equipment.

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All products and information are subject to change without notice.