Raman Spectroscopy >
Photoluminescence spectroscopy is a efficient, non-destructive and contactless method of probing electronic properties of material, especially for direct-band semiconductors.
Measurement of photoluminescence (PL) spectra from semiconductor materials is an important characterisation method and is widely accepted for providing information on carrier doping levels, alloy composition, bandgap and edge effects, etc. The ability to measure UV
Resonance Raman spectra adds specificity and enhanced characterisation of materials. These measurements are important both for research, device characterisation and process monitoring.
Photon Systems' Deep UV (DUV) MiniPL/Raman Spectrometer provides the most compact and inexpensive
instrument available at these wavelengths. Enabling PL
and Raman spectra measurement of semiconductor materials with bandgap up to about 5.5eV corresponding to AlGaN with Al concentrations up over 80%.
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